GSO IEC 62374:2014
IEC 62374:2007
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
GSO IEC 62374:2014 Files
English
43 Pages
Current Edition
Reference Language
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GSO IEC 62374:2014 Scope
This International Standard provides a test method of Time Dependent Dielectric Breakdown
(TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation
method of TDDB failure.
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