GSO IEC 60749-1:2014
IEC 60749-1:2002
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
GSO IEC 60749-1:2014 Files
English
15 Pages
Current Edition
Reference Language
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GSO IEC 60749-1:2014 Scope
This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. In the case of contradiction between this standard and a relevant procurement specification, the latter should govern.
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