GSO IEC 60749-32:2014
IEC 60749-32:2002
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
GSO IEC 60749-32:2014 Files
English
9 Pages
Current Edition
Reference Language
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GSO IEC 60749-32:2014 Scope
This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits).
The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to clauses 2 and 3 and renumbering.
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